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WQF-2004 Dynamic Micro Aerosol Generator

Conditions, using four samples, testing the dynamic performance of micro aerosol generator, the results shown in Table l ~ 4. Table I, it is kind of a gasification test results in Table 2 the results of the second sample test gasification of solid gasification Table 3 The third test is kind of environmental conditions - 20 ~ C6H95290RCH2. 390RCHl4 analytical instruments 1, 2008 Four kinds of sample test results show that the generator is stable and reproducible, both environmental conditions at room temperature or in heat, humidity and low temperature conditions,[link widoczny dla zalogowanych], could be used to complete the work, and easy to operate, practical . 5 Conclusion The generator has two characteristics: first, to continuously generate a stable concentration of gases and aerosols, shortening the evaluation period; second gas with clever qi, so that the air flow throughout the gas system remain change or remain basically unchanged. WQF a Dynamic trace aerosol generator 2004, to meet the needs of the instrument testing, improve efficiency, save costs, increase security, reduce the work intensity. Currently, there are five models, thousands of instrument was tested using this generator. WQF trace of a 2004-type aerosol generator dynamic development, has been the PLA Institute of Chemical Defense Liunan Sheng, Zhou Fujun two researchers of the support,[link widoczny dla zalogowanych], guidance and help, here express my heartfelt thanks to them. Received :2007-09-11DevelopmentofWQF-2004dynamictraceaerosolgenerator. LiZhiyong (BeijingCityBeifenInstru-mentTechnologyCompany, Beijing, 100095) Adynamictraceaerosolgeneratorwasdeveloped. Thebasicprinciple, compositon, gasflowsystem, circuitryandperformancetestresultsofthegeneratoraredescribed. Business Business Business Business Business Business Business Business Business; Applications:} titi titi titi pedicle pedicled with X-ray diffraction analysis of the sample alignment error correction ability Zhu Hong Spring Zhang Jin Chao (1. Changchun Institute of Optics Fine Mechanics and Physics Institute, State Key Laboratory of Applied Optics, Changchun, 130022; 2. Graduate School of Chinese Academy of Sciences, Beijing 100039, China) Abstract The x-ray diffraction analysis of samples, testing the size of the angle error of the accuracy of the analysis,[link widoczny dla zalogowanych], and sample loading The offset error causes the test point error analysis of this system, the test sample alignment angle error. Concluded that the eccentric rotation error of measurement error and errors are obvious, the general need to be adjusted; pitch error on the measurement of small, generally not corrected. Experiments show that the alignment of the sample through the post-correction error and eccentric rotation error, random error of measuring angles can be controlled at 0.006. (2e) or less, and cycle thickness of about 17nm [Mo / Si] multilayers the thickness of the test cycle accurate to 0.1nm, for the very high-precision thickness control of the ultraviolet region to provide a guarantee. Key words X-ray diffraction alignment of the sample rotation angle error error error eccentric pitch error correction 1 Introduction X-ray diffraction measurement of the basic task is to sample the diffraction intensity of the diffraction angle changes with the spectrum. Then the diffraction spectrum of different ways to parse the structure of the corresponding samples to obtain information. For example: For polycrystalline or single crystal samples, it is desirable standards of the diffraction peaks of powder diffraction patterns and comparing the samples obtained crystal structure; on the film sample, according to the diffraction peaks at all levels to calculate the film thickness _】], but also building model,[link widoczny dla zalogowanych], fitting the reflectance spectrum, thin films of various structural parameters obtained _2]. But whatever way, require accurate information on the diffraction angle. However, in the actual X-ray diffraction measurements,[link widoczny dla zalogowanych], the sample alignment is completed, the sample surface at the zero position, sometimes deviate from the beam center line and the composition of the goniometer axis plane (see Figure 1), this error is called the sample loading transfer error. Alignment error of the measurement process will lead to deviation from the ideal position of reflected light, causing the angle measurement error. Analysis of this alignment error of the system to test the impact of angular error, and author: Hong Zhu force, June 1983 born, male, Han nationality, Xiangfan, Hubei Province, Master, the main research direction is the thermal stability of thin film, optical thin film design and measurement. E-mail: zhll050l @ l63. com
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